@inproceedings{a18fad0e59d14a1db0049aa0edb69ef6,
title = "Time of flight secondary ion mass spectrometry examination of ancient and historical opaque glasses",
abstract = "This paper presents recent work done on the application of Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS), a high lateral resolution surface analysis technique, to the study of opacifying inclusions in ancient and historical glasses. A small selection of ancient glass samples have thus far been analyzed by this technique with great success. The combination of surface sensitivity and high lateral resolution offered by the technique is uniquely placed to address the detailed chemical composition of the opacifying inclusions themselves, without interference from the surrounding glass matrix. The research team seeks to further develop the use of ToF-SIMS for addressing issues of provenance and understanding the technological processes involved in adding opacifying inclusions to ancient glass, through further analysis of relevant material and through the production and analysis of replica opaque glasses. The technique itself will be discussed along with some of the preliminary results obtained and proposals for future work in this field.",
keywords = "Ancient Glass, Archaeometry, Opacifiers, Production Technology, Provenance, ToF-SIMS",
author = "Duckworth, {Chlo{\"e} N.} and Julian Henderson and Rutten, {Frank J.M.}",
year = "2012",
doi = "10.1117/12.979791",
language = "English",
isbn = "9780819491046",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
booktitle = "Integrated Approaches to the Study of Historical Glass - IAS12",
address = "United States",
note = "Integrated Approaches to the Study of Historical Glass Conference, IASHG 2012 ; Conference date: 16-04-2012 Through 17-04-2012",
}