Electron transport properties of sub-3-nm diameter copper nanowires

Sarah L.T. Jones, Alfonso Sanchez-Soares, John J. Plombon, Ananth P. Kaushik, Roger E. Nagle, James S. Clarke, James C. Greer

Research output: Journal PublicationArticlepeer-review

28 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Electron transport properties of sub-3-nm diameter copper nanowires'. Together they form a unique fingerprint.

Keyphrases

Material Science