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Four-dimensional Dopant Profiling for Rapid Prototyping and Fabrication of Nanoscale Semiconductor Devices Using Novel Combined SEM / FIB Techniques
Chee, Kuan
(PI)
Department of Electrical and Electronic Engineering
Overview
Project Details
Status
Finished
Effective start/end date
1/01/17
→
31/12/18
Funding
National Natural Science Foundation of China (NSFC):
CN¥399,960.00
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