Four-dimensional Dopant Profiling for Rapid Prototyping and Fabrication of Nanoscale Semiconductor Devices Using Novel Combined SEM / FIB Techniques

  • Chee, Kuan (PI)

Project Details

StatusFinished
Effective start/end date1/01/1731/12/18

Funding

  • National Natural Science Foundation of China (NSFC): CN¥399,960.00