TY - GEN
T1 - Computer aided diagnosis of nuclear cataract
AU - Li, Huiqi
AU - Joo, Hwee Lim
AU - Liu, Jiang
AU - Wong, Damon Wing Kee
AU - Wong, T. Y.
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2008
Y1 - 2008
N2 - An approach to automatically diagnose nuclear cataract based on the slit-lamp image is proposed in this paper. Model-based approach is investigated to detect robust lens structure. Based on the detected lens structure, the mean intensity, the color information on the posterior subcapsular reflex and visual axis profile are extracted as the grading features. Support Vector Machine (SVM) regression model is further trained to predict the grades of nuclear cataract automatically. The proposed approach was tested using 900 images and the mean grading error is 0.36. The encouraging results show that it is promising to apply the proposed approach to clinical diagnosis.
AB - An approach to automatically diagnose nuclear cataract based on the slit-lamp image is proposed in this paper. Model-based approach is investigated to detect robust lens structure. Based on the detected lens structure, the mean intensity, the color information on the posterior subcapsular reflex and visual axis profile are extracted as the grading features. Support Vector Machine (SVM) regression model is further trained to predict the grades of nuclear cataract automatically. The proposed approach was tested using 900 images and the mean grading error is 0.36. The encouraging results show that it is promising to apply the proposed approach to clinical diagnosis.
UR - http://www.scopus.com/inward/record.url?scp=51949086169&partnerID=8YFLogxK
U2 - 10.1109/ICIEA.2008.4582838
DO - 10.1109/ICIEA.2008.4582838
M3 - Conference contribution
AN - SCOPUS:51949086169
SN - 9781424417186
T3 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
SP - 1841
EP - 1844
BT - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
T2 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
Y2 - 3 June 2008 through 5 June 2008
ER -