@inproceedings{d775dbe7d7cb446985a9f262625f5e25,
title = "Feasibility study of small features extraction for 3D image rendering",
abstract = "Most notably CAD models now contain many details which are irrelevant to simulation disciplines and image rendering applications. However, CAD systems have feature trees which record feature creation, does not capture which features are relevant to the 3D image rendering discipline. Many features of little significance to an analysis only emerge during the CAD modeling but not specifically for 3D rendering or CAE analysis. Thus, the ability to selectively suppress and reinstate features while maintaining an audit trail of changes is required to facilitate the control of the idealization process. Features suppressed for one analysis can be retrieved for use in another. This work explores a common CAD model to examine its small features that are useful or needed in the 3D surface rendering of design works. The Initial Graphics Exchange Specification (IGES) defines a neutral data format that allows the digital exchange of information among Computer-aided design (CAD) systems. Irrelevant features can then be suppressed and subsequently reinstated, within defined limitations, independently from the order in which they were suppressed. The implementation of these concepts provides analysts with a mechanism for 3D surface rendering. This paper intends to explore into a new area of solving IGES small features based rendering technique that is compatible or suppressible with the CAD and CAE models.",
author = "Ong, {Chi Wei} and Xin Wang and Lee, {Kok Yong} and Tan, {Ching Seong} and Ooi, {Jong Boon}",
year = "2011",
language = "English",
isbn = "9781618393432",
series = "50th Annual Conference of the British Institute of Non-Destructive Testing 2011, NDT 2011 Held in conjunction with the Materials Testing Exhibition, MT 2011",
publisher = "British Institute of Non-Destructive Testing",
pages = "155--166",
booktitle = "50th Annual Conference of the British Institute of Non-Destructive Testing 2011, NDT 2011 Held in conjunction with the Materials Testing Exhibition, MT 2011",
address = "United Kingdom",
note = "50th Annual Conference of the British Institute of Non-Destructive Testing 2011, BINDT 2011 ; Conference date: 13-09-2011 Through 15-09-2011",
}